The SVI team has released Huygens version 4.2 with many new additions including a brand new STED deconvolution option.

Tests with the LEICA STED microscopes images deconvolved with Huygens STED deconvolution show a huge increase in contrast (~10 times), more resolution in Z, and a significant improvement in the already high lateral STED resolution, revealing spatial detail that can only be seen after deconvolution!

Huygens takes the specific STED parameters into consideration that are reported by the LEICA LIF files. But STED parameters can also be automatically estimated from bead images using the Huygens PSF distiller, which has been specifically extended to fullfil this task.

Batch wise deconvolution of STED images is also possible with the 4.2 Batch Processor.

In addition many other new functionalities have been added to the Huygens software that are available for customers with active licenses.

For example, both the Huygens Essential and Professional 4.2 include a completely new hot pixel removal tool that not only detects but also corrects for hot pixels. The deconvolution wizard has now image comparison tools integrated, and the Colocalization Analyzer is extended with smart background estimators.
We also added to all Huygens basics support of very large tiff files (larger than 4 GB); also known as BigTiffs.
These and all other new features can be viewed at here.