Differential Interference Contrast
Differential interference contrast microscopy (DIC) is an optical microscopy illumination technique used to enhance the contrast in unstained samples. DIC works on the principle of interferometry to gain information about the optical density of the sample, to see otherwise invisible features. (Wikipedia).
Because DIC is a Non Linear imaging system, deconvolution can't be easily applied to it.
Nevertheless, Huygens users have reported that applying deconvolution with the Huygens Software to 2D DIC images can improve the contrast within images and thus the visibility of the object, and should be regarded only as a method for Image Enhancement.