Data Acquisition related questions
Sampling
See UnderSampling.
If the pinhole is specified in terms of Airy units the backprojected radius is computed as (from the FAQ): backprojected_RADIUS = number_of_Airy_disks * 0.61 * $$\frac{\lambda}{NA}$$
To compute the backprojected radius from the physical pinhole size see the tables in the Huygens Essential or Professional User Guide.If you have loaded an image in Huygens Pro, select it and select Edit-> Nyquist you get a report of the sampling situation taking into account all known parameters. Rule of thumb is for WF: 100nm lateral or better; around 200nm axially. 250nm would be fine too, but we distrust some z-motors with round numbers.
In Huygens Pro the optimal sampling density for the optical conditions under which an image is recorded can be computed by selecting its thumbnail and then Edit->Nyquist. When an image is recorded at this so called Nyquist frequency the digitized sequence contains *all* information carried in the signal. This makes it possible to reconstruct the image at any location, so not limited to the sampling positions. The Nyquist frequency is twice the highest spatial frequency (bandlimit) transmitted by the microscope.
In the Huygens the stepsize (in any direction) is just the distance between samples, 'sampling distance'. Also, in all directions the numbering starts with 0, so the index for N samples runs from 0..N-1. This is the conventional way of indexing samples. Some microscope manufacturers use a special 1..N numbering scheme in the z-direction, but still 0..N-1 in the XY plane.
- Gonzalez, R.C. and R.E. Woods. (1992) Digital Image Processing. Addison-Wesley. ISBN 0-201-50803-6. p111 e.v.
For a discussion of microscopical bandpass characteristics see the papers below. Be sure to read both!
- Sheppard, C.J.R.The spatial frequency cut-off in three-dimensional imaging. (1986a). Optik 72 No. 4 131-133.
- Sheppard, C.J.R.The spatial frequency cut-off in three-dimensional imaging II. (1986b). Optik 74 No. 3, pp. 128-129.
Widefield microscope: Nyquist_lateral = \lambda$$ / ( 4 n sin(\alpha$$)) Nyquist_axial = \lambda$$ / ( 4 n (1 - cos(\alpha$$))) with \lambda$$ the wavelength, N$$ the refractive index of the medium (1.515 for immersion oil). \alpha$$ is the half-aperture angle obtained with: \alpha = arcsin(NA/N)$$ with NA$$ the Numerical aperture. Many calculators use the 'sin-1' or 'asin' symbol for the arcsin function. Confocal microscope: Assuming the excitation and emission wavelength are equal a confocal microscope doubles the bandwidth so halves the Nyquist sampling density.
Both Huygens Pro and Essential take the exact wavelength into account when computing the Nyquist rate. In case of multi photon excitation they also take the number of excitation photons into account. Both will color the background of X, Y, Z sampling density entry fields orange (moderate undersampling) or red (serious undersampling) when detecting undersampling. In Huygens Pro you can look up the Nyquist rate for a particular image by selecting it and Edit->Nyquist rate.After deconvolution the remaining geometric distortion can be corrected by multiplying the z-sampling distance by the ratio of the medium and immersion refractive index, a number in most of the cases < 1. See also [FishtankEffect|Fishtank Effect]
In Essential
- If you have an image for which you want to compute the Nyquist rate, open it and check its parameters (right click -> "Show parameters").
- Whenever you change the Microscopic Parameters of an image, the Nyquist rate is recalculated. Modify the image parameters to match the microscopic conditions for which you want to compute the Nyquist rate, then check the parameters again (right click -> "Show parameters").
In Professional
- Select the image, select Edit -> Nyquist rate in the main menu. You'll get a popup displaying the Nyquist rate.
Importantly, the 3D shape of the band-pass area is very different: while the widefield area has a wedge at the center causing the large widefield blur cones, the 2-photon bandpass area has no such defects.
Old information
In principle, the Nyquist rate is independent of the pinhole size. This is due to the choice to relate the Nyquist rate to the theoretical bandwidth of the system: the spatial frequency beyond which *nothing* is transferred by the microscope. It would be a different story if we would have used a criterion based on attenuation of spatial frequencies below a certain factor. (Larger pinhole sizes attenuate higher frequencies more, but still are not zero). Although a practical approach (because about last third of the band has so low intensities that they can be considered zero most of the times) this involves an arbitrary choice, so therefore we base the Nyquist rate on the well defined theoretical bandwidth.
A 'typical' widefield setup (1.3 effective NA lens, 500nm emission) is sampled well at 100 nm laterally, 300 nm axially. However, due to good SNR ratio's deconvolution can often gain a lot in Z, so you might as well go for 200 nm. With a 100x lens and a CCD with 6.7 micron cells you get 67 nm laterally. (This is assuming that there is no extra magnification; otherwise the total magnification must be used when calculating the pixel size). If this bloats your data too much you can try binning to increase the lateral size to 134 nm, but you will already start seeing some 'staircasing' effects on thin filaments in the deconvolved image (Aliasing Artifacts).
In the same typical confocal case a nice sampling rate would be 50 nm in Z, 150 nm axially. In case of bleaching problems you can stretch this up to 75 nm lateral, and after that increase the Z-sampling.
- Confocal microscopes: While sampling at the Nyquist rate is a very good idea, it is in many practical situations hard to attain. In these cases larger sampling distances may be used. For confocal images with a Airy disk sized pinhole the lateral sampling distance may be up to about 1.6 of the Nyquist distance. When much larger pinholes are used, up to 2x.
When very small pinholes are used to optimize resolution, or any other case where high resolution is required, we do not not recommend undersampling since this would defeat the purpose, and since it might limit the deconvolution result.
- Two photon microscopes: Two photon microscopes without a detection pinhole (e.g. non descanned systems) follow the rules of a small pinhole confocal microscope relative to the longer excitation wavelength. The addition of a detection pinhole increases the theoretical bandwidth, but since usually large pinholes are used the practical bandwidth increase is small.
- Spinning (Nipkow) disk microscopes: Regarding sampling criteria spinning disk microscopes behave like confocal microscopes with, depending on the disk, a fairly large pinhole. For a typical system we do not recommend more than 1.6 times undersampling.
- Widefield: Widefield data are more sensitive to undersampling; stay below 1.3. In case of low numerical apertures like 0.4 we recommend not to undersample in the axial direction.
- STED : The remarkable property of STED microscopes is that they do not have a band limit in the strict sense. That means that any sampling rate is a compromise between practical considerations and the to be reached resolution. Since lateral STED HIW resolution can achieve 50nm in good conditions we recommend sampling around 25nm. In difficult condition this can be increased, but that will limit deconvolution.
- Multi channel data: The sampling rate should be derived from the highest resolution channel.
The actual and the ideal sampling distances of an image can be seen in Huygens Essential right-clicking on the image thumbnail and choosing 'Show parameters'.
According to the Nyquist theorem a signal should be sampled at twice its highest bandwidth so confocal microscopes need twice the sampling density of widefield microscopes. Although the confocal microscope is able to transmit twice as fine details as the widefield microscope, it attenuates these very strongly. Beyond say 60% of the highest frequency practically nothing is transmitted, especially for not-ideal pinhole cases. Therefore, while sampling according to Nyquist rate remains the safest solution, in the case of confocal imaging it is defensible to reduce the sampling rate to about 60% of the theoretical rate, for example in typical condition one sample per 50/0.6 = 80nm.
In the widefield case, high spatial frequencies are also attenuated as the band limit is approached, but to a much lesser degree than in the confocal case. Therefore we do not recommend to stay below 1.3 of the Nyquist rate. In case of low numerical apertures like 0.4 we recommend not to undersample widefield images in the axial direction.
A practical example:
Assuming a 1.3 N.A. objective lens and 488nm excitation, 520nm emission you need to sample around 50 x 50 x 165 nm to get an optimally sampled confocal 3D image; 100 x 100 x 330 nm in the 3D widefield case. As mentioned above, widefield images are more sensitive to undersampling, i.e. a violation of the sampling rule has a more dramatic effect on widefield images than on confocal images.