Wavelength is the distance between two consecutive crests of a wave. In the optical range it is usually measured in nanometers (nm). In optical microscopy involving fluorescence, two wavelengths are important: the Excitation Wavelength and the Emission Wavelength.

The lower the WaveLengths involved in the measurement, the higher the resolution. This dependency was described by Ernst Karl Abbe and later in an equation describing the diffraction limit. For a good measurement you must adapt the Sampling Density accordingly to the Nyquist Rate.

Huygens Essential will warn you if the difference between the reported Excitation Wavelength and Emission Wavelength is larger than 20%. This is just a reminder based on that many Fluoro Chromes have the difference in wavelength inside this range. But other, as DAPI, have a larger difference. To make a proper deconvolution the correct values must be reported, despite the warning message.

Upcoming Events

Thu 20 of Sep, 2018 16:51 CEST
Huygens Imaging Course in September 2018
Thu 27 of Sep, 2018
Huygens Workshop at NKI
Mon 12 of Nov, 2018
Huygens HRM Hackaton 2018

Contact Information

Scientific Volume Imaging B.V.

Laapersveld 63
1213 VB Hilversum
The Netherlands

Phone: +31 (0)35 64216 26
Fax: +31 (0)35 683 7971
E-mail: info at svi.nl

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