SVI and Abberior Instruments announce collaboration in STED imaging

Friday 01 of March, 2019
Abberior Svi Collaboration

The recent and most fruitful collaboration between Abberior Instruments and SVI has brought about cutting-edge superresolution at maximum convenience and benefit for STEDYCON users.

The easiest, most compact and most affordable STED system available, now also includes an efficient connection to the Huygens Software. This new feature allows researchers get the most out of their high-quality STED images by using the powerful and renowned Huygens MLE deconvolution algorithms and image analysis modules.

The combination of state-of-the-art STED imaging with a sophisticated deconvolution method reveals the faintest details in the sample . Moreover, all this unfolds at the push of a button!

Learn all about this and more and join our upcoming STED webinar!

For STEDYCON questions & quotations contact sales at abberior-instruments.com

Connection to Huygens Professional

Huygens now fully supports the latest STEDYCON OBF data format. Users can open OBF data directly in Huygens via drag-and-drop or via the regular open image dialog. With the latest software (both Huygens and STEDYCON), Huygens automatically reads in all meta-data required for accurate deconvolution and further processing.
The STEDYCON Smart Control acquisition software also introduces a new feature that allows users to send any image from their imaging session to Huygens Professional with a single mouse-click. The dataset can be easily deconvolved in Huygens via the fully automated Deconvolution Express, or with the Deconvolution Wizard/Batch Processor when the users prefers full parameter control.

Learn more about this on our HUYGENS for Abberior STEDYCON page

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