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News

Webinar in italiano su deconvoluzione con Huygens

Wednesday 14 of June, 2017
Il webinar su deconvoluzione con Huygens, organizzato il 13 Luglio,spiega come ottimizzare i parametri di acquisizione e di successiva deconvoluzione con Huygens per ottenere risultati ottimali. Inoltre, sono forniti alcuni esempi su come la deconvoluzione sia un ottimo metodo per ottenere risultati piú robusti per l'analisi di colocalizzazione, tracking ed analisi di oggetti.

Il webinar era live il 13 Luglio alle 15:30. Per avere una registrazione del webinar, scrivete una mail a giulia at svi.nl.

How to optimize your deconvolution results? Watch the Acquisition pitfalls and Huygens deconvolution webinar!

Wednesday 14 of June, 2017
The Acquisition pitfalls and Huygens deconvolution webinar was organized live the 28th of June. It offered a general overview about the imaging work-flow for deconvolution, from the acquisition to the deconvolution procedure itself, in order to optimize your results. The basic acquisition pitfalls for deconvolution were discussed, with indications on how to avoid them. The Huygens deconvolution procedure were explained and demonstrated, focusing on the Huygens parameter and deconvolution editors. The new features were also explained, as the easy to use Deconvolution Express for a one-click deconvolution result, or the Huygens Batch Processor now combined with Huygens multi-GPU acceleration.

This webinar is not online anymore. Join us in the upcoming webinars listed here.

Huygens 17.04 now available including SPIM/LightSheet Fusion & Deconvolution Wizard!

Friday 28 of April, 2017
Huygens has a SPIM optical option available for excellent deconvolution for more than a year but specific fusion still needed to be done manually. Now we have released also the SPIM/ LightSheet Fusion & Deconvolution Wizard in the new 17.04 version of Huygens

Combined with the SPIM/LightSheet optical Option we offer a wizard-based solution in which deconvolution, scattering correction, and restoration (fusion) of various types of multiview SPIM/Light sheet data is combined to facilitate efficient use of computational resources.

Accurate registration and fusion of multi-directional and rotational views of 3D times series is fully automated, and specific optical parameters for SPIM/Light Sheet images - like sheet direction, NA, fill factor, and focus and lateral offset - ensure optimal deconvolution results. Additional scatter models are available for correcting apparent Rayleigh scattering.

You can find the 17.04 release on the Huygens Download page and you can request a test license after starting Huygens Professional for instance.

New Portal to Full Customer information in one go

Wednesday 22 of March, 2017
This portal is ideal both for the novel and the experienced users of Huygens. Do you have a specific question or are you interested in testing the Huygens deconvolution, visualization, restoration and analysis options? We are happy to help you by guiding you through the most important steps as license request and installation, acquisition optimization, deconvolution optimization and support from SVI. You can find more information via our new Huygens User starting page:

https://svi.nl/HuygensStart

Huygens Remote Manager 3.4 released

Monday 30 of January, 2017
We are proud to announce the release of HRM 3.4! This release comes with a few big and many small changes in preparation for the release of HRM 4.0 that will be majestic!
The new features at a glance are:
  • Enhanced user management and security
  • Multi-GPU support
  • Chunked, parallel file uploader
  • Support for Metamorph ND and Leica LOF files

For more information, see http://www.huygens-rm.org/wp/

Two 1st Prize Winners of this years Huygens Image Contest!

Friday 16 of December, 2016
After carefully reviewing the submitted contest images for the Huygens Image Contest 2016, we selected five prize winners . Two 1st prizes were selected for the category "Cells" and "Tissues and Organisms". The two first prizes, which are a ASUS Chromebook. go to Dr. Daniela Malide (Light Microscopy Core Facility, National Heart, Blood and Lung Institute, USA) and Mrs. Outi Paloheimo (University of Tampere, Finland).

Upper image: Huygens deconvolved confocal and STED image of mitochondria and cytoskeletal tubulin in COS-7 (Daniela Malide)
Bottom image: Huygens deconvolved confocal image of portion of a wing from cabbage butterfly (Mrs. Outi Paloheimo)

Look on WinnersImageContest2016 for more details of these and the other winners images.

Huygens software version 16.10 is released!

Wednesday 02 of November, 2016
Scientific Volume Imaging proudly announces that the Huygens Software version 16.10 is available for download!

Some highlights of the new and improved features in this new version are:

  • New Deconvolution Express option: a new method to do unsupervised deconvolution to get a quick, effortless deconvolution result, requiring no further user action. If needed, the user can fine-tune the method used for unsupervised deconvolution. Deconvolution Express offers a choice of fast, standard, conservative or aggressive methods.
  • GPU support for the most commonly used type of background estimation: the 'lowest' background mode.
  • Improved adaptation of brick layout to the available GPU memory
  • New SPIM/light sheet types now include Multi View 'MuVi', Bessel beam, two-photon Bessel beam.
  • New and improved interface for the Object Stabilizer with GPU support for cross correlation stabilization method.
  • Chromatic Aberration Corrector:
  • GPU support for the shift correction method in the Chromatic Aberration Corrector.
  • New Huygens Server for communicating with Leica's LAS X software.

Getting the software
Huygens Suite 16.10 can be downloaded from the SVI website via this link. If you have a valid maintenance contract, you should have received your new license(s) by email. If not, or if you would like to have a look at the latest options, please contact us at sales at svi.nl for your license.

Do you want to know more about the new features of the Huygens software?
In case you want to have an insight on the new features of Huygens you can watch our What's New webinar, streamed live the 17th of November, available until the 24th of November at this page.

Today is the 384th Birthday of Antonie van Leeuwenhoek

Monday 24 of October, 2016
Today is the 384th Birthday of Antonie van Leeuwenhoek (October 24, 1632 – August 26, 1723). Van Leeuwenhoek was a Dutch scientist and is widely known as "the Father of Microbiology".
He is best known for his work on the improvement of the microscope, and is considered to be the first microbiologist.
van Leeuwenhoek was a member of the Royal Society in London and was in close contact with fellow member Christiaan Huygens (1629-1695), our Software's icon. Both renowned scientists have greatly contributed to the fields of optics and microscopy.

The picture on the left is a portrait of Antonie van Leeuwenhoek by Jan Verkolje, the painting is located at the Rijksmuseum in Amsterdam.

Measuring the 3D STED-PSF with a new Type of Fluorescent Beads

Wednesday 28 of September, 2016
GATTAquant has recently launched a new type of fluorescent beads for super-resolution microscopy. In combination with state-of the-art STED microscopes such as the Leica TCS SP8 STED 3X and high-end image restoration methods available in the Huygens Software, it is shown that these new GATTA-Beads can be used for accurate STED PSF characterization in 3D. Read more in the latest article on Leica Science Lab.

Are you interested in testing the availability of the Huygens-Leica data exchange option?

Wednesday 14 of September, 2016
A convenient direct connection between the Leica software and the Huygens software is available for exporting images directly from the Leica acquisition software to Huygens Essential and Professional, and vice-versa. You can check here if your current software configuration supports this option. We are happy to help you at sales at svi.nl if you have further inquiries or if you are interested in testing it!

Contact Information

Scientific Volume Imaging B.V.

Laapersveld 63
1213 VB Hilversum
The Netherlands


Phone: +31 (0)35 64216 26
Fax: +31 (0)35 683 7971
E-mail: info at svi.nl

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